Frequency-dependent mutual resistance and inductance formulas for coupled IC interconnects on an Si-SiO2 substrate
✍ Scribed by Hasan Ymeri; Bart Nauwelaers; Karen Maex
- Publisher
- Elsevier Science
- Year
- 2001
- Tongue
- English
- Weight
- 219 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0167-9260
No coin nor oath required. For personal study only.
✦ Synopsis
A highly accurate closed-form approximation of frequency-dependent mutual impedance per unit length of a lossy silicon substrate coplanar-strip IC interconnects is developed. The derivation is based on a quasistationary full-wave analysis and Fourier integral transformation. The derivation shows the mathematical approximations which are needed in obtaining the desired expressions. As a result, for the first time, we present a new simple, yet surprisingly accurate closed-form expression which yield accurate estimates of frequency-dependent mutual resistance and inductance per unit length of coupled interconnects for a wide range of geometrical and technological parameters. The developed formulas describe the mutual line impedance behaviour over the whole frequency range ( i.e. also in the transition region between the skin effect, slow wave, and dielectric quasi-TEM modes). The results have been compared with the reported data obtained by the modified quasi-static spectral domain approach and new CAD-oriented equivalent-circuit model procedure.