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Freeze-out effects on NMOS transistor characteristics at 4.2 K

✍ Scribed by Simoen, E.; Dierickx, B.; Warmerdam, L.; Vermeiren, J.; Claeys, C.

Book ID: 114535386
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 569 KB
Volume: 36
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.24362

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