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Free ion transport in the insulator layer and electron-ion exchange at an insulator-semiconductor phase boundary produced as a result of thermally stimulated ionic depolarization of silicon MOS structures

✍ Scribed by E. I. Gol’dman; A. G. Zhdan; G. V. Chucheva


Book ID
110120158
Publisher
Springer
Year
1999
Tongue
English
Weight
79 KB
Volume
33
Category
Article
ISSN
1063-7826

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