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Free-exciton confinement by layer stacking faults in GaSe: Evidence from time-resolved spectroscopy

✍ Scribed by Zhang, X. -C.; Gal, M.; Nurmikko, A. V.


Book ID
121666472
Publisher
The American Physical Society
Year
1984
Tongue
English
Weight
184 KB
Volume
30
Category
Article
ISSN
1098-0121

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