Fractional duration before first failure—a useful index and an analytical tool : C. Singh and J. S. Duggal. Microelectron. Reliab. 24, 1077 (1984)

• Book ID: 103279238
• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 128 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(85)90563-3