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Fractal Dimension-Based Damage Detection Method for Beams with a Uniform Cross-Section

✍ Scribed by Hui Li; Yong Huang; Jinping Ou; Yuequan Bao

Book ID
110986005
Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
374 KB
Volume
26
Category
Article
ISSN
1093-9687

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A simple method for ohmic loss in conduc
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The high-frequency skin-depth approximation for ohmic loss calculations is not ¨alid if the conductor thickness decreases and approaches the skin depth. This is the situation in many monolithic ( ) microwa¨e integrated circuits MMICs . The two asymptotes of loss, at dc and at high frequency of the a