✦ LIBER ✦
Fractal analysis and atomic force microscopy measurements of surface roughness for Hastelloy C276 substrates and amorphous alumina buffer layers in coated conductors
✍ Scribed by F. Feng; K. Shi; S.-Z. Xiao; Y.-Y. Zhang; Z.-J. Zhao; Z. Wang; J.-J. Wei; Z. Han
- Book ID
- 116244875
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 968 KB
- Volume
- 258
- Category
- Article
- ISSN
- 0169-4332
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