Time-of-flight effects in matrix-assiste
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T.-P. E. Sze; T.-W. Dominic Chan
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Article
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1999
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John Wiley and Sons
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English
โ 137 KB
๐ 2 views
The time-of-flight effect in Fourier transform mass spectrometry (FTMS) with an external ion source was quantified. The time-of-flight profiles of ions of different masses were measured by stepping the time interval between the ionization pulse and the gating of the trapping voltage (T gate ). The o