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Fourier transform IR monitoring of porous silicon passivation during post-treatments such as anodic oxidation and contact with organic solvents

✍ Scribed by M.A. Hory; R. Hérino; M. Ligeon; F. Muller; F. Gaspard; I. Mihalcescu; J.C. Vial


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
429 KB
Volume
255
Category
Article
ISSN
0040-6090

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