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Fourier transform infrared surface electromagnetic wave spectroscopy of polymer thin films on metallic substrate

โœ Scribed by Ishino, Yuichi.; Ishida, Hatsuo.

Book ID
126225753
Publisher
American Chemical Society
Year
1986
Tongue
English
Weight
745 KB
Volume
58
Category
Article
ISSN
0003-2700

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Among the various analysis modes which can be used in FTIR spectroscopy, the internal reflection mode enables us to gain near-surface information on solids or liquids. The interaction between the evanescent field created upon internal reflection of the infrared beam and a sample can be used to monit