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Fourier transform infrared spectroscopy study of molecular structure formation in thin films during hexamethyldisiloxane decomposition in low pressure rf discharge

✍ Scribed by Li, K; Gabriel, O; Meichsner, J


Book ID
120395401
Publisher
Institute of Physics
Year
2004
Tongue
English
Weight
450 KB
Volume
37
Category
Article
ISSN
0022-3727

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