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Fourier transform infrared microscopy: some advances in techniques for characterisation and structure–property elucidations of industrial material†

✍ Scribed by Chalmers, John M.; Everall, Neil J.; Hewitson, Karen; Chesters, Michael A.; Pearson, Martin; Grady, Andrew; Ruzicka, Barbara


Book ID
120928966
Publisher
Royal Society of Chemistry
Year
1998
Tongue
English
Weight
412 KB
Volume
123
Category
Article
ISSN
0003-2654

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