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Forming gas anneal induced flat-band voltage shift of metal-oxide-semiconductor stacks and its link with hydrogen incorporation in metal gates

✍ Scribed by Z. Li; T. Schram; L. Pantisano; T. Witters; A. Stesmans; A. Akheyar; V.V. Afanasiev; N. Yamada; T. Takaaki; S. De Gendt; K. De Meyer


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
492 KB
Volume
84
Category
Article
ISSN
0167-9317

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