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Formation of shape and structure in freezing-on A babbitt layer

✍ Scribed by A. G. Gromyko

Publisher
Springer US
Year
1998
Tongue
English
Weight
418 KB
Volume
40
Category
Article
ISSN
0026-0673

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## Abstract A dislocation structure of Si layers crystallized from a floating grain on quartz glass and mullite ceramics substrates has been investigated by transmission electron microscopy (TEM) including the high‐voltage one. The effect of the layer orientation on the crystallographic features of