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Formation of Ohmic contacts in AlGaN/GaN HEMT structures at 500 °C by Ohmic contact recess etching

✍ Scribed by W.S. Lau; J.B.H. Tan; B.P. Singh


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
480 KB
Volume
49
Category
Article
ISSN
0026-2714

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