Formation of desired concentration profiles of embedded atoms and radiation-induced defects by using monochromatic fast ion beams

✍ Scribed by G. M. Gusinskii; A. V. Matyukov

• Book ID: 110131276
• Publisher: Springer
• Year: 2002
• Tongue: English
• Weight: 91 KB
• Volume: 47
• Category: Article
• ISSN: 1063-7842
• DOI: 10.1134/1.1479986