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Formation, Characterization, and Sub-50-nm Patterning of Organosilane Monolayers with Embedded Disulfide Bonds: An Engineered Self-Assembled Monolayer Resist for Electron-Beam Lithography

✍ Scribed by Wang, Xuejun; Hu, Wenchuang; Ramasubramaniam, Rajagopal; Bernstein, Gary H.; Snider, Gregory; Lieberman, Marya


Book ID
127080753
Publisher
American Chemical Society
Year
2003
Tongue
English
Weight
988 KB
Volume
19
Category
Article
ISSN
0743-7463

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