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Formation and Depth Profiling Analysis of Multilayers Derived from Sol-Gel Processing Using Dynamic SIMS, RBS, and TEM

✍ Scribed by N. Bazin; J.E. Andrew; H.A. McInnes


Book ID
110267233
Publisher
Springer
Year
2000
Tongue
English
Weight
101 KB
Volume
19
Category
Article
ISSN
0928-0707

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