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Forensic analysis of tempered sheet glass by particle induced X-ray emission (PIXE)

✍ Scribed by L.J. Jisonna; P.A. DeYoung; J. Ferens; C. Hall; J.M. Lunderberg; P. Mears; D. Padilla; G.F. Peaslee; R. Sampson

No coin nor oath required. For personal study only.

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