✦ LIBER ✦
Forces in Scanning Probe Methods || Atomic-Resolution Image of GaAs(110) Surface with an Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)
✍ Scribed by Güntherodt, H. J.; Anselmetti, D.; Meyer, E.
- Book ID
- 120219372
- Publisher
- Springer Netherlands
- Year
- 1995
- Weight
- 643 KB
- Category
- Article
- ISBN
- 9401100497
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