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Focusing Properties of X-Ray Spectrometers with 2D-Curved Crystals for Extended X-Ray Sources of Hot Plasmas

✍ Scribed by B.S. Fraenkel; M. Bitter; S.von Goeler; K. Hill

Book ID: 112261469
Publisher: IOS Press
Year: 1997
Tongue: English
Weight: 275 KB
Volume: 7
Category: Article
ISSN: 0895-3996
DOI: 10.1006/jxra.1997.0245

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