Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron

✍ Scribed by Masakazu Oikawa; Takahiro Satoh; Takuro Sakai; Nobumasa Miyawaki; Hirotsugu Kashiwagi; Satoshi Kurashima; Susumu Okumura; Mitsuhiro Fukuda; Watalu Yokota; Tomihiro Kamiya

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 555 KB
• Volume: 260
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2007.01.280

✦ Synopsis

Performance of a focusing high-energy heavy ion microbeam system in TIARA facility of JAEA Takasaki was tested for the spatial resolution and for the hitting accuracy at a target. A 260 MeV 20 Ne 7+ ion beam was successfully extracted from the JAEA AVF cyclotron (K = 110) with the smallest momentum spread (DP/P = d) at present. The beam was focused by the microbeam lens system, and a spatial resolution of 260 MeV 20 Ne 7+ microbeam was measured from a secondary electron image of a Cu grid which had sharp edges, and the hitting accuracy was estimated using single ion hitting onto a CR-39 film. From those two methods of measurement, both the spatial resolution and the hitting accuracy were evaluated at less than 1 lm.