Focused ion beam/scanning electron microscopy tomography and conventional transmission electron microscopy assessment of Ni4Ti3 morphology in compression-aged Ni-rich Ni–Ti single crystals

✍ Scribed by Shanshan Cao; Christoph Somsen; Mihail Croitoru; Dominique Schryvers; Gunther Eggeler

• Book ID: 113898230
• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 283 KB
• Volume: 62
• Category: Article
• ISSN: 1359-6462
• DOI: 10.1016/j.scriptamat.2009.11.040