✦ LIBER ✦
Focused ion beam processing of organic crystal (TMTSF)[sub 2]PF[sub 6]. A combined conducting probe atomic force microscopy and secondary ion mass spectrometry study
✍ Scribed by Wang, K.; Schneegans, O.; Moradpour, A.; Jomard, F.
- Book ID
- 121808510
- Publisher
- American Institute of Physics
- Year
- 2008
- Tongue
- English
- Weight
- 468 KB
- Volume
- 103
- Category
- Article
- ISSN
- 0021-8979
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