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Flux focusing in all high-Tc Josephson edge junctions and SQUIDs

✍ Scribed by E. Aharoni; G. Koren; Daniel Cohen; David Cohen


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
420 KB
Volume
202
Category
Article
ISSN
0921-4534

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We have investigated the flux state in high-T c circuits based on multilayer structures including La-doped YBCO (La-YBCO) ground plane by a scanning SQUID microscope (SSM) system. The circuits contained via holes in the insulating layer and the ground plane. They were post-annealed in flowing oxygen