Fluorescence Resonance Energy Transfer Near Thin Films on Surfaces
β Scribed by Joel I. Gersten
- Book ID
- 107379984
- Publisher
- Springer US
- Year
- 2007
- Tongue
- English
- Weight
- 305 KB
- Volume
- 2
- Category
- Article
- ISSN
- 1557-1955
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π SIMILAR VOLUMES
A surface-kapping model is applied to near-resonant eIectronic energy transfer in the NF-Bi and 02-I systems\_ Multiple surface cr6~ occur in NF-Bi at ca. 8 A. corresponding we11 with tile measured transfer cross section of 200 A2\_ A L~I&I.u Zencr model yields the temperature dependence of the ther
## Abstract Ellipsometry used in internal reflection mode exhibits enhanced thin film sensitivity if operated close to surface plasmon resonance conditions. Compared to conventional ellipsometry, the changes in the ellipsometric parameter __Ξ__ are several orders of magnitude larger. Here, the orig