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Flaw characterization based on diffraction of ultrasonic waves

✍ Scribed by F.K. Lam; W.M. Tsang

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 658 KB
Volume: 23
Category: Article
ISSN: 0041-624X
DOI: 10.1016/0041-624x(85)90006-x

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