𝔖 Bobbio Scriptorium
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First results in micromapping the sensitivity to SEE of an electronic device in a SOI technology at the LNL IEEM

✍ Scribed by S. Mattiazzo; D. Bisello; P. Giubilato; A. Kaminsky; D. Pantano; L. Silvestrin; M. Tessaro; J. Wyss


Book ID
113822064
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
389 KB
Volume
658
Category
Article
ISSN
0168-9002

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