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First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials

✍ Scribed by J. X. Zheng; G. Ceder; W. K. Chim


Book ID
112182742
Publisher
John Wiley and Sons
Year
2008
Tongue
English
Weight
277 KB
Volume
2
Category
Article
ISSN
1862-6254

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