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First-principles investigation of radiation induced defects in Si and SiC

✍ Scribed by Wolfgang Windl; Thomas J Lenosky; Joel D Kress; Arthur F Voter

Book ID: 114170107
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 98 KB
Volume: 141
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(98)00082-2

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