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First principles calculations of hydrogen annealed amorphous SiO2 structures and Si/SiO2 interface for non volatile memories

✍ Scribed by A Courtot-Descharles; P Paillet; J.L Leray; O Musseau


Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
203 KB
Volume
3
Category
Article
ISSN
1369-8001

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