Interface Applications of Scanning Near-
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Cricenti, A. ;Generosi, R. ;Perfetti, P. ;Margaritondo, G. ;Almeida, J. ;Gilliga
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Article
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1999
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John Wiley and Sons
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English
โ 384 KB
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The study of semiconductor interfaces and of solid interfaces in general requires novel instrument capable to investigate the lateral fluctuations of properties on a microscopic scale. We present the first result of a major effort in that framework, whose main objective is the exploitation of the un