First direct beta measurement for parasitic lateral bipolar transistors in fully-depleted SOI MOSFET's

✍ Scribed by Ver Ploeg, E.; Nguyen, C.; Kistler, N.; Wong, S.; Woo, J.; Plummer, J.

• Book ID: 114535271
• Publisher: IEEE
• Year: 1993
• Tongue: English
• Weight: 275 KB
• Volume: 40
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.239766