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Finite-Thickness Conductor Models for Full-Wave Analysis of Interconnects With a Fast Integral Equation Method

✍ Scribed by Morsey, J.D.; Okhmatovski, V.I.; Cangellaris, A.C.

Book ID: 126822014
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 612 KB
Volume: 27
Category: Article
ISSN: 1521-3323
DOI: 10.1109/tadvp.2004.825459

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