Finite Element Method Simulation of the Field Distribution for AFM Tip-Enhanced Surface-Enhanced Raman Scanning Microscopy

✍ Scribed by Micic, Miodrag; Klymyshyn, Nicholas; Suh, Yung Doug; Lu, H. Peter

• Book ID: 126305223
• Publisher: American Chemical Society
• Year: 2003
• Tongue: English
• Weight: 362 KB
• Volume: 107
• Category: Article
• ISSN: 0022-3654
• DOI: 10.1021/jp022060s