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Finite-Element Analysis of Current-Induced Thermal Stress in a Conducting Sphere

✍ Scribed by Ming Liu; Fuqian Yang

Book ID
107457411
Publisher
Springer US
Year
2011
Tongue
English
Weight
728 KB
Volume
41
Category
Article
ISSN
0361-5235

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The thermal, shear and radial stresses generated in the Ti coating deposited on glass and Si substrates were investigated by finite element analysis (ANSYS). The four-node structural and quadratic element PLANE 42 with axisymmetric option were used to model the Ti coating on glass and Si substrates.