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Finite element analysis and experimental verification of SOI waveguide bending loss

✍ Scribed by H. Srinivasan; B. Bommalakunta; A. Chamberlain; J. T. Hastings

Publisher: John Wiley and Sons
Year: 2009
Tongue: English
Weight: 166 KB
Volume: 51
Category: Article
ISSN: 0895-2477
DOI: 10.1002/mop.24135

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✦ Synopsis

Abstract

Bending and transition losses in silicon‐on‐insulator rib waveguides were calculated using finite‐element analysis of equivalent straight waveguides with perfectly matched boundary layers. Experimental loss measurements of silicon‐on‐insulator waveguides with various bend radii reveal that this technique accurately predicts loss and minimum bend radius for efficient design. © 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 699–702, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24135

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