Fine structure of scanning field emission microscope (SFEM) image

✍ Scribed by B Barwinski; S Sendecki

• Book ID: 104265787
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 401 KB
• Volume: 47
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/s0042-207x(96)00222-9

✦ Synopsis

New results of imaging of field emission tungsten tip by means of scanning field emission microscope are presented. The fine structure of the SFEM image was revealed by means of differentiation along the scan

lines. The new patterns obtained in this way were explained by assuming that there are two superimposed images with different magnifications and resolutions. The revealed fine structure is assumed to be related to surface atomic structure of the tip. We supposed that the atoms can be treated as protrusions on the otherwise smooth surface. Due to the smaller radius than this for the entire tip, the protrusions show greater magnification, which results in atomic resolution.