✦ LIBER ✦
Finding the reliable transistor—the mechanical and thermal testing of silicon planar devices : J. M. Groocock. British Communications and Electronics, Vol. 12, No. 7, July 1965, p. 429
- Book ID
- 113190174
- Publisher
- Elsevier Science
- Year
- 1965
- Tongue
- English
- Weight
- 193 KB
- Volume
- 4
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.