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Film-Flow Mechanism of Flaw Development in Penetrant-Dye Tests

✍ Scribed by N. P. Migun; P. P. Prokhorenko; S. G. Chizh

Book ID: 110425720
Publisher: SP MAIK Nauka/Interperiodica
Year: 2002
Tongue: English
Weight: 720 KB
Volume: 38
Category: Article
ISSN: 1061-8309
DOI: 10.1023/a:1022818508002

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