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Field ion microscopy in materials science: R. Wagner. Springer-Verlag, Berlin, Heidelberg and New York (1982), 115 pp. Price: $38.00

✍ Scribed by Tien T. Tsong


Book ID
113186814
Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
99 KB
Volume
19
Category
Article
ISSN
0025-5408

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