<p>Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in
Field-Ion Microscopy
β Scribed by E. W. MΓΌller (auth.), John J. Hren, S. Ranganathan (eds.)
- Publisher
- Springer US
- Year
- 1968
- Tongue
- English
- Leaves
- 256
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Table of Contents
Front Matter....Pages i-xiv
The Theoretical and Technical Development of Field-Ion Microscopy....Pages 1-5
Field Emission and Field Ionization....Pages 6-27
Field Evaporation....Pages 28-52
Gas Impact, Field Etching, and Field Deformation....Pages 53-68
Some Geometrical Aspects of Surfaces Related to Field-Ion Microscopy....Pages 69-87
Artifacts, Hydrogen Promotion, and Field-Ion Microscopy of Nonrefractory Metals....Pages 88-101
Interpretation of Field-Ion Microscope Images of Point and Line Defects....Pages 102-119
Field-Ion Microscope Studies of Planar Faults....Pages 120-136
Field-Ion Microscope Studies of Interfaces....Pages 137-156
Experimental Studies of Alloys with Field-Ion Microscope....Pages 157-170
Field-Ion Microscope Studies of Radiation Damage....Pages 171-182
Field-Ion Microscopy of Whiskers and thin Films and Applications (Real and Imagined) to Mass Spectrometry and Biological Molecule Imaging....Pages 183-212
Back Matter....Pages 213-244
β¦ Subjects
Characterization and Evaluation of Materials
π SIMILAR VOLUMES
Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals
Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals
Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals
Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals