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Field-Emission Breakdown and Electromigration in Insulated Planar Nanoscopic Contacts

✍ Scribed by Alessandro Bramanti; Giuseppe Maruccio; Paolo Visconti; Stefano D'Amico; Roberto Cingolani; Ross Rinaldi

Book ID: 119816499
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 605 KB
Volume: 53
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2006.885659

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