✦ LIBER ✦
Field data collection and reliability assurance of solid state devices for industrial use : Yoshihiko Nakamura, Katsuhisa Kimura and Yoshihito Shirai. Proceedings 1973 IEEE Annual Reliability Maintainability Symposium. 23–25 January (1973), p. 208
- Book ID
- 103272811
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 214 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0026-2714
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