Field-assisted ion exchange for the detection of localized defects in thin films on glass substrates

✍ Scribed by B.G. Pantchev; P. Danesh

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 505 KB
• Volume: 161
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(88)90238-6