✦ LIBER ✦
Field Acceleration Model for TDDB: Still a Valid Tool to Study the Reliability of Thick SiO2-Based Dielectric Layers?
✍ Scribed by Oussalah, S.; Djezzar, B.
- Book ID
- 114618796
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 187 KB
- Volume
- 54
- Category
- Article
- ISSN
- 0018-9383
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