FIB-SIMS quantification using TOF-SIMS with Ar and Xe plasma sources

✍ Scribed by Stevie, F. A.; Sedlacek, L.; Babor, P.; Jiruse, J.; Principe, E.; Klosova, K.

• Book ID: 121785882
• Publisher: John Wiley and Sons
• Year: 2014
• Tongue: English
• Weight: 217 KB
• Volume: 46
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/sia.5483