Low-Temperature Electronic Properties of
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K. Sreedhar; M. McElfresh; D. Perry; D. Kim; P. Metcalf; J.M. Honig
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Article
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1994
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Elsevier Science
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English
⚖ 645 KB
Measurements of the temperature dependence of the electrical resistivity \(\rho(T)\), magnetic susceptibility \(\chi(T)\), and Seebeck coefficient \(S(T)\) have been carried out on the \(n=2,3\), and \(\infty\) members of the homologous lanthanum nickel oxide systems \(\mathrm{La}_{n+1} \mathrm{Ni}_