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Fermi-Level Pinning Induced Thermal Instability in the Effective Work Function of TaN in<tex>$hbox TaN/SiO_2$</tex>Gate Stack

✍ Scribed by Ren, C.; Yu, H.Y.; Kang, J.F.; Hou, Y.T.; Li, M.-F.; Wang, W.D.; Chan, D.S.H.; Kwong, D.-L.


Book ID
121325103
Publisher
IEEE
Year
2004
Tongue
English
Weight
146 KB
Volume
25
Category
Article
ISSN
0741-3106

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