Fermi-level pinning at the polysilicon/metal oxide interface-Part I

✍ Scribed by Hobbs, C.C.; Fonseca, L.R.C.; Knizhnik, A.; Dhandapani, V.; Samavedam, S.B.; Taylor, W.J.; Grant, J.M.; Dip, L.G.; Triyoso, D.H.; Hegde, R.I.; Gilmer, D.C.; Garcia, R.; Roan, D.; Lovejoy, M.L.; Rai, R.S.; Hebert, E.A.; Hsing-Huang Tseng; Anderson, S.G.H.; White, B.E.; Tobin, P.J.

• Book ID: 114617458
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 267 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2004.829513